Transmission electron microscope

Principle

Transmission electron microscopy (TEM) involves imaging an ultrathin sample (natural or "slice" obtained by ultramicrotomy) by means of a dilated electron beam that passes through the entire sample at the same time.

Instruments available:

Campus CS

Description

Brand : JEOL
Model : JEM-2100
Type : Microscope électronique en Transmission
Electron source : LaB6 filament
High voltage : 200kV
Pole piece : Cryo
Maximum resolution: image mode 0.14nm, point mode 0.27nm
Max magnification: x 1.000.000
2 cameras (Gatan): SC200D, US4000
STEM detector (JEOL) : Bright field, Dark Field
EDX detector (Bruker) : XFlash 5030
EELS, EFTEM energy filter (Gatan): GIF Quantum
MDS "minimum dose system" (JEOL)
Anti-contamination system (ACD)
Motorised sample displacement with magnification control
Magnification: up to x 1000.000
Sample holders (JEOL): Standard, Beryllium (EDX), Quartet, Electron Tomography
Sample holders Cryo + temperature controller (Gatan)
Software: JEOL (TEM /STEM settings, STEM acquisition), Gatan DigitalMicrograph GMS 2 (TEM image acquisition, tomography, EELS, EFTEM...), Bruker Esprit 2 (EDX analysis)

Applications

TEM (Transmission Electron Microscopy) observations: Bright field, Dark Field
STEM (Scanning Transmission Electron Microscopy) observations: Bright field, Dark Field, HAADF
Electron Tomography (Gatan software)
Cryo-observation
Chemical analysis: EDX / EELS

Location: Cité Scientifique - Building SN3 - Basement

Contact : Loïc Brunet | 03.20.43.41.03

Rate of use

54€/hour " for internal academics " (supply of liquid nitrogen in addition)
67€/hour "for external academics" (liquid nitrogen supply not included)
Sample preparation (on quotation)
Rates for all services for private companies (on request)

Booking